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CEI EN 60747-15 : 2012

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Superseded date

29-01-2025

Superseded by

CEI EN IEC 60747-15:2025

£48.44
Excluding VAT
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings (limiting
  values) and characteristics
6 Measurement methods
7 Acceptance and reliability
Annex A (informative) - Test
        method of peak case
        non-rupture current
Annex B (informative) - Measuring
        method of the thickness
        of thermal compound paste
Bibliography

Gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-100. (11/2012)
DocumentType
Standard
Pages
32
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy

Standards Relationship
IEC 60747-15:2010 Identical
EN 60747-15:2012 Identical

⚠

A newer version of this standard is available.

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£48.44
Excluding VAT