CEI EN 61000-4-11 : 2006
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS
Hardcopy , PDF
English - Italian
01-02-2006
20-10-2020
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test levels
6 Test instrumentation
7 Test set-up
8 Test procedures
9 Evaluation of test results
10 Test report
Annex A (normative) - Test circuit details
Annex B (informative) - Electromagnetic environment
classes
Annex C (informative) - Test instrumentation
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding
European publications
Describes the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations.
| Committee |
CT 210
|
| DevelopmentNote |
Classificazione CEI 110-29 (09/2001) AMD 1 Issued on 01/01/2018 is only available in English. (02/2018)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| EN 61000-4-11:2004/A1:2017 | Identical |
| IEC 61000-4-11:2004+AMD1:2017 CSV | Identical |
| IEC 61000-2-4:2002 | Electromagnetic compatibility (EMC) - Part 2-4: Environment - Compatibility levels in industrial plants for low-frequency conducted disturbances |
| IEC 61000-4-14:1999+AMD1:2001+AMD2:2009 CSV | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase |
| IEC TR 61000-2-8:2002 | Electromagnetic compatibility (EMC) - Part 2-8: Environment - Voltage dips and short interruptions on public electric power supply systems with statistical measurement results |
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