CEI EN 62132-8 : 2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 8: MEASUREMENT OF RADIATED IMMUNITY - IC STRIPLINE METHOD
Hardcopy , PDF
English
01-01-2013
16-05-2026
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
10 RF immunity acceptance level
Annex A (normative) - Field strength
determination
Annex B (normative) - IC stripline
descriptions
Annex C (informative) - Closed stripline
geometrical limitations
Bibliography
Specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-106. To be read in conjunction with CEI EN 62132-1. (07/2013)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| EN 62132-8:2012 | Identical |
| IEC 62132-8:2012 | Identical |
| EN 62132-1:2016 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| EN 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
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