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CEI EN 62215-3 : 2014

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY - PART 3: NON-SYNCHRONOUS TRANSIENT INJECTION METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2014

£75.74
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Coupling networks
6 IC configuration and evaluation
7 Test conditions
8 Test equipment
9 Test set up
10 Test procedure
11 Test report
Annex A (informative) - Test board recommendations
Annex B (informative) - Selection hints for coupling
        and decoupling network values
Annex C (informative) - Industrial and consumer
        applications
Annex D (informative) - Vehicle applications
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-117. (05/2014)
DocumentType
Standard
Pages
40
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 62215-3:2013 Identical
IEC 62215-3:2013 Identical

EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
ISO 7637-2:2011 Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical transient conduction along supply lines only
IEC 61000-4-4:2012 RLV Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
EN 61000-4-4:2012 Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

£75.74
Excluding VAT