DIN EN 60749-33:2004-09
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE
Hardcopy , PDF
German
01-01-2004
FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
Publications
Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.
| DevelopmentNote |
Supersedes DIN IEC 60749-33. (09/2004)
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60749-33:2004 | Identical |
| NBN EN 60749-33 : 2005 | Identical |
| I.S. EN 60749-33:2004 | Identical |
| NF EN 60749-33 : 2005 | Identical |
| BS EN 60749-33:2004 | Identical |
| IEC 60749-33:2004 | Identical |
| UNE-EN 60749-33:2005 | Identical |
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