• Shopping Cart
    There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

DIN EN 60749-40:2012-02

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE (IEC 60749-40:2011)

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2012

£92.84
Excluding VAT

DevelopmentNote
Supersedes DIN IEC 60749-40. (02/2012)
DocumentType
Standard
Pages
23
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current
Supersedes

Standards Relationship
EN 60749-40:2011 Identical
IEC 60749-40:2011 Identical

£92.84
Excluding VAT