Buy DIN EN 60749-44:2017-04 | Intertek Inform

Customer Support: +44 (0)203 327 3140

Login to i2i Subscription Intertek.com

Shopping Cart

There are no items in your cart
Log into your Account
Email Address * Please enter your email Password * Please enter your password Forgot password?
Create account?
Error occured. Please try again

We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.

Go to AMERICAS site

header thumbnail

header thumbnail

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES (IEC 60749-44:2016)

Published date

18-08-2014

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

Add to Watchlist

Sorry this product is not available in your region.

DocumentType	Standard
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current

Standards	Relationship
EN 60749-44:2016	Identical
BIS IS/IEC 61558-2-6 : 1ED 2016	Identical
BIS IS/IEC 61558-2-6 : 1ED 2016	Identical

Summarise

ChatGPT Perplexity

Sorry this product is not available in your region.

Please Wait...