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DIN EN 60749-44:2017-04

DIN EN 60749-44:2017-04

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES (IEC 60749-44:2016)

Published date

01-04-2017

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

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Summarise this standard

DocumentType
Standard
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current

Standards Relationship
EN 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical

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