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DS/EN IEC 60749-30:2020

Current

Current

The latest, up-to-date edition.

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Published date

29-09-2020

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This part of IEC 60749 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.

Committee
DS/V-001
DocumentType
Test Method
PublisherName
Danish Standards
Status
Current

Standards Relationship
IEC 60749-30:2020 Identical
EN IEC 60749-30:2020 Identical

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