DSCC 89601K:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE, MONOLITHIC SILICON
Published date
24-01-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V).
| DocumentType |
Revision
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
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| Supersedes |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-HDBK-103 Revision AA:2007 | List of Standard Microcircuit Drawings |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision L:2018 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
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