DSCC V62/25651:2025
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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MICROCIRCUIT, LINEAR, BiCMOS, CURRENT MODE, SINGLE-ENDED PWM CONTROLLER WITH AN INTEGRATED GATE DRIVER, MONOLITHIC SILICON
Published date
23-09-2025
Publisher
Superseded date
12-03-2026
Superseded by
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This drawing documents the general requirements of a radiation tolerant, current mode, single-ended PWM controller with an integrated gate driver microcircuit, with an operating temperature range of -55C to +125C.
| DocumentType |
Standard
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Superseded
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| SupersededBy |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JEP155:2008 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| JEDEC JESD 22-C101:1995 | |
| ANSI/ESDA/JEDEC JS-001:2023 | JOINT JEDEC/ESDA STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TEST - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL |
| JEDEC JEP 157 : 2009 | RECOMMENDED ESD-CDM TARGET LEVELS |
Summarise
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