IEC 60393-1:2008

FOREWORD
1 General
  1.1 Scope
  1.2 Normative references
2 Technical data
  2.1 Units and symbols
  2.2 Terms and definitions
  2.3 Preferred values
  2.4 Marking
3 Assessment procedures
4 Test and measurement procedures
  4.1 General
  4.2 Standard atmospheric conditions
  4.3 Drying
  4.4 Visual examination and check of dimensions
  4.5 Continuity (except for continuously rotating
       potentiometers)
  4.6 Element resistance
  4.7 Terminal resistance
  4.8 Maximum attenuation
  4.9 Resistance law (conformity)
  4.10 Matching of the resistance law (for ganged
       potentiometers only)
  4.11 Switch contact resistance (when appropriate)
  4.12 Voltage proof (insulated styles only)
  4.13 Insulation resistance (insulated styles only)
  4.14 Variation of resistance with temperature
  4.15 Rotational noise
  4.16 Contact resistance at low-voltage levels
  4.17 Setting ability (adjustability) and setting
       stability
  4.18 Starting torque
  4.19 Switch torque
  4.20 End stop torque
  4.21 Locking torque
  4.22 Thrust and pull on shaft
  4.23 Shaft run-out
  4.24 Lateral run-out
  4.25 Pilot (or spigot) diameter run-out
  4.26 Shaft end play
  4.27 Backlash
  4.28 Dither
  4.29 Output smoothness
  4.30 Robustness of terminals
  4.31 Sealing
  4.32 Solderability
  4.33 Resistance to soldering heat
  4.34 Change of temperature
  4.35 Vibration
  4.36 Bump
  4.37 Shock
  4.38 Climatic sequence
  4.39 Damp heat, steady state
  4.40 Mechanical endurance (potentiometers)
  4.41 AC endurance testing of mains switches on
       capacitive loads
  4.42 DC endurance testing of switches
  4.43 Electrical endurance
  4.44 Component solvent resistance
  4.45 Solvent resistance of the marking
  4.46 Microlinearity
  4.47 Mounting (for surface mount potentiometers)
  4.48 Shear (adhesion) test
  4.49 Substrate bending test (formerly bond strength
       of the end face plating)
  4.50 Solderability (for surface mount potentiometers)
  4.51 Resistance to soldering heat (for surface mount
       potentiometers)
Annex A (normative) Rules for the preparation of detail
        specifications for capacitors and resistors for
        electronic equipment
Annex B (normative) Interpretation of sampling plans
        and procedures as described in IEC 60410 for
        use within the IEC Quality Assessment System
        for Electronic Components
Annex C (normative) Measuring methods for rotational noise
Annex D (normative) Apparatus for measuring mechanical
        accuracy
Annex E (normative) Measuring method for microlinearity
Annex F (normative) Preferred dimensions of shaft ends,
        bushes and for the mounting hole, bush-mounted,
        shaft-operated electronic components
Annex G (informative) Example of common potentiometer's
        law
Annex H (normative) Quality assessment procedures

IEC 60393-1:2008 is applicable to all types of resistive potentiometers, including lead- screw actuated types, presets, multi-turn units, etc., to be used in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. It has been mainly written, and the test methods described, to conform to the widely used single-turn rotary potentiometer with an operating shaft. This edition contains the following significant technical changes with respect to the previous edition: implementation of Annex H which replaces Section 3 of the previous edition. It also includes minor revisions related to tables, figures and references.