IEC 60410:1973
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Sampling plans and procedures for inspection by attributes
Hardcopy , PDF
English - French, English, French
01-01-1973
31-12-2021
FOREWORD
PREFACE
Clause
1 Scope
2 Classification of defects and defectives
3 Percent defective and defects per hundred units
4 Acceptable quality level (AQL)
5 Submission of product
6 Acceptance and rejection
7 Drawing of samples
8 Normal, tightened and reduced inspection
9 Sampling plans
10 Determination of acceptability
11 Supplementary information
APPENDIX A Index of terms with special meanings
Tables
I Sample size code letters
II-A Single sampling plans for normal inspection (master
table)
II-B Single sampling plans for tightened inspection
(master table)
II-C Single sampling plans for reduced inspection (master
table)
III-A Double sampling plans for normal inspection (master
table)
III-B Double sampling plans for tightened inspection
(master table)
III-C Double sampling plans for reduced inspection (master
table)
IV-A Multiple sampling plans for normal inspection
(master table)
IV-B Multiple sampling plans for tightened inspection
(master table)
IV-C Multiple sampling plans for reduced inspection
(master table)
V-A Average outgoing quality limit factors for normal
inspection (single sampling)
V-B Average outgoing quality limit factors for
tightened inspection (single sampling)
VI-A Limiting quality (in per cent defective) for which
P = 10% (for normal inspection, single sampling)
VI-B Limiting quality (in defects per hundred units) for
which P = 10% (for normal inspection, single
sampling)
VII-A Limiting quality (in per cent defective) for which
P = 5% (for normal inspection, single sampling)
VII-B Limiting quality (in defects per hundred units)
for which P = 5% (for normal inspection, single
sampling)
VIII Limit numbers for reduced inspection
IX Average sample size curves for double and multiple
sampling
Sampling plans and operating characteristic curves
(and data) for:
X-A Sample size code letter A
X-B Sample size code letter B
X-C Sample size code letter C
X-D Sample size code letter D
X-E Sample size code letter E
X-F Sample size code letter F
X-G Sample size code letter G
X-H Sample size code letter H
X-J Sample size code letter J
X-K Sample size code letter K
X-L Sample size code letter L
X-M Sample size code letter M
X-N Sample size code letter N
X-P Sample size code letter P
X-Q Sample size code letter Q
X-R Sample size code letter R
X-S Sample size code letter S
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.
| DevelopmentNote |
Stability Date: 2015. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
82
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NBN C 83 100 : 1984 | Identical |
| NBN C 86 010 : 1984 | Identical |
| NBN C 83 355-4 : 1985 AMD 1 1990 | Identical |
| DIN 45902-2;CECC 00007:1975-05 | Similar to |
| NBN C 83 255-1 : 1979 | Identical |
| NBN C 90 202 : 1983 | Identical |
| NEN 10410 : 1973 | Identical |
| DIN ISO 2859-1:2014-08 | Identical |
| NBN C 83 250 : 1984 AMD 1 1988 | Identical |
| NBN C 83 355 : 1985 | Identical |
| BS 6001-1:1972 | Similar to |
| NBN C 83 200 : 1984 | Identical |
This standard has been withdrawn and is no longer current. No replacement edition is available.
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