IEC 60444-7:2004
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
Hardcopy , PDF
English, English - French
05-04-2004
IEC 60444-7:2004 applies to activity and frequency dips for quartz crystal units over a temperature range.
| Committee |
TC 49
|
| DevelopmentNote |
A Bilingual edition has been published. (05/2013) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60444-7 : 2004 | Identical |
| NEN EN IEC 60444-7 : 2004 | Identical |
| PN EN 60444-7 : 2005 | Identical |
| SAC GB/T 22319-7 : 2015 | Identical |
| BS EN 60444-7:2004 | Identical |
| CEI EN 60444-7 : 2005 | Identical |
| EN 60444-7:2004 | Identical |
| DIN EN 60444-7:2004-11 | Identical |
| UNE-EN 60444-7:2004 | Identical |
| I.S. EN 60444-8:2017 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
| EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
| BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
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