IEC 60749-18:2019
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Hardcopy , PDF
English - French
10-04-2019
IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-6755-4
|
| Pages |
44
|
| ProductNote |
THIS STANDARD ALSO REFERS TO MIL-STD-883J
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| CEI EN IEC 60749-18 : 2019 | Identical |
| BS EN IEC 60749-18:2019 | Identical |
| EN IEC 60749-18:2019 | Identical |
| NF EN IEC 60749-18:2019 | Identical |
| OVE EN IEC 60749-18: 2020 03 01 | Identical |
| DIN EN IEC 60749-18:2020-02 | Identical |
| UNE-EN IEC 60749-18:2019 | Identical |
| I.S. EN IEC 60749-18:2019 | Identical |
| NEN EN IEC 60749-18 : 2019 | Identical |
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