IEC 61163-1:2006
Current
The latest, up-to-date edition.
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
Hardcopy , PDF
English - French
26-06-2006
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols
5 General description
5.1 The reliability stress screening principle
5.2 Failure categories
5.3 Time of occurrence of failures
6 Planning
6.1 Stress conditioning
6.2 Evaluation of the failure-free period T[M]
6.3 Time graphs for determination of the failure-free period
7 Pilot-production screening
7.1 General
7.2 Collection of information
7.3 Evaluation of information
7.4 Re-evaluating the failure-free period T[M]
8 Mature production screening
8.1 General
8.2 Collection of information
8.3 Evaluation of information
8.4 Dealing with discrepancies
8.5 Eliminating reliability stress screening
Annex A (informative) Stress conditions - General information
Annex B (informative) Stress conditions - Temperature
Annex C (informative) Stress conditions - Vibration and bump
Annex D (informative) Stress conditions - Humidity
Annex E (informative) Stress conditions - Operational stress
Annex F (informative) Voltage stress
Annex G (informative) Highly accelerated stress screening
Annex H (informative) Bimodal distributions - Weibull plotting
and analysis
Annex I (informative) Evaluation of the failure-free period
and the average screening duration
Annex J (informative) Worked example
Bibliography
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
| Committee |
TC 56
|
| DevelopmentNote |
Together with IEC 61163-2, supersedes IEC 60300-3-7. (07/2007) Stability Date: 2018. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
161
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 61163-1 : 2007 | Identical |
| NEN EN IEC 61163-1 : 2007 | Identical |
| I.S. EN 61163-1:2006 | Identical |
| PN EN 61163-1 : 2008 | Identical |
| BIS IS 15444-1 : 2012(R2016) | Identical |
| BS EN 61163-1:2006 | Identical |
| CEI EN 61163-1 : 2007 | Identical |
| EN 61163-1:2006 | Identical |
| DIN EN 61163-1:2007-06 | Identical |
| UNE-EN 61163-1:2006 | Identical |
| NEN IEC 61163-1 : 95 C1 2000 | Identical |
| CEI 56-35 : 1ED 2000 | Identical |
| UNE-EN 61163-1:2010 | Identical |
| NEN 11163-1 : 1995 | Identical |
| UNE 200004-1:2002 | Identical |
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