IEC 62860:2013
Current
Current
The latest, up-to-date edition.
Test methods for the characterization of organic transistors and materials
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
05-08-2013
Publisher
1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants
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