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IEC TS 62396-5:2008

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

19-08-2008

Superseded date

22-08-2014

Superseded by

IEC 62396-5:2014

£104.15
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Overview of thermal neutron single event rate calculation
5 Thermal neutron flux inside an airliner
  5.1 Definition of thermal neutron
  5.2 Overview
  5.3 Background on aircraft measurements
  5.4 Calculational approach
  5.5 Processing of in-flight neutron flux data
6 Thermal neutron SEU cross sections
  6.1 Overview of the issue
  6.2 Mechanism involved
  6.3 Thermal neutron SEU cross sections and Ratio-2
7 Recommendation for devices in avionics at present time
Bibliography

IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).

DevelopmentNote
Supersedes IEC PAS 62396-5. (08/2008) Stability Date: 2013. (10/2012)
DocumentType
Technical Specification
Pages
18
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
NEN NPR IEC/TS 62396-5 : 2008 Identical
DD IEC TS 62396-5 : DRAFT OCT 2008 Identical

15/30324422 DC : 0 BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
BS IEC 62396-1 : 2016 PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
11/30256756 DC : 0 BS EN 62396-2 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
14/30299002 DC : 0 BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
11/30246255 DC : 0 BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
PD IEC/PAS 62396-6:2014 Process management for avionics. Atmospheric radiation effects Extreme space weather and potential impact on the avionics environment and electronics

IEC TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

£104.15
Excluding VAT