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IEEE 1445-1998

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

IEEE Standard for Digital Test Interchange Format (DTIF)

Available format(s)

PDF

Language(s)

English

Published date

10-03-1999

Superseded date

19-10-2021

£95.46
Excluding VAT

1. Overview
2. Normative references
3. Definitions, acronyms and abbreviations
4. Data organization overview of the DTIF
   standard environment
5. File type specifications
6. Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - Example of a circuit used in
        a test simulation
Annex C (informative) - Bibliography

Specifies DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing.

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote
Supersedes IEEE DRAFT 1445. (11/1999)
DocumentType
Standard
Pages
108
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy
Supersedes

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DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
BS IEC 62529:2012 IEEE standard for signal and test definition
IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE DRAFT 1546 : D3.0 2000 DRAFT GUIDE FOR DIGITAL TEST INTERCHANGE FORMAT (DTIF) APPLICATION
IEEE 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEC 62529:2012 Standard for Signal and Test Definition

£95.46
Excluding VAT