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IEEE
IEEE 1671.6-2015 REDLINE

IEEE 1671.6-2015 REDLINE

Current

Current

The latest, up-to-date edition.

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-05-2015

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Schema - TestStationDescription.xsd
5 Schema - TestStationInstance.xsd
6 ATML TestStationDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - User's information and
        examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography

This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote
PDF along with XML Schemas and reference example files is also available in zip format. (05/2015) Also numbered as IEC 61671-6. (04/2016)
DocumentType
Standard
ISBN
978-0-7381-9624-4
Pages
63
PublisherName
Institute of Electrical & Electronics Engineers
Status
Current
Supersedes

DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
BS IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
IEEE 1871.2-2017 IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

IEEE 1671-2010 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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Hardcopy - English
PDF - English
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