IEEE C62.59-2019
Current
The latest, up-to-date edition.
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
Hardcopy , PDF
English
31-10-2019
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.
| Committee |
Surge Protective Devices/Low Voltage
|
| DocumentType |
Test Method
|
| ISBN |
978-1-5044-6119-1
|
| Pages |
41
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| IEEE C62.42.3-2017 | IEEE Guide for the Application of Surge Protective Components in Surge Protective Devices and Equipment Ports -- Part 3: Silicon PN-Junction |
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