IEEE C62.59-2019
Current
Current
The latest, up-to-date edition.
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
31-10-2019
This standard sets terms, test methods, test circuits, measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems.
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