ISO 6342:2003
Current
Current
The latest, up-to-date edition.
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Available format(s)
PDF
Language(s)
English
Published date
15-07-2003
Excluding VAT
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
| Committee |
ISO/TC 171
|
| DevelopmentNote |
Supersedes ISO/DIS 6342 (07/2003)
|
| DocumentType |
Standard
|
| Pages |
3
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN ISO 6342 : 2003 | Identical |
| PN ISO 6342 : 2005 | Identical |
| BS ISO 6342:1993 | Identical |
| NFZ 43 085 : 96 XP | MICROGRAPHICS - A6 SIZE APERTURE CARDS |
| BS ISO 3272-3:2001 | Microfilming of technical drawings and other drawing office documents Aperture card for 35 mm microfilm |
| ISO 10549:2000 | Micrographics — A6 size aperture cards |
| ISO 3272-3:2001 | Microfilming of technical drawings and other drawing office documents — Part 3: Aperture card for 35 mm microfilm |
| ISO 6196-4:1998 | Micrographics — Vocabulary — Part 4: Materials and packaging |
| ISO 6196-1:1993 | Micrographics — Vocabulary — Part 1: General terms |
| ISO 534:2011 | Paper and board — Determination of thickness, density and specific volume |
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