JEDEC JESD51-6:1999
Current
The latest, up-to-date edition.
Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
Hardcopy , PDF
English
01-03-1999
This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard test board.
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| SupersededBy |
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