JEDEC JESD61A.01:2007(R2025)
Current
The latest, up-to-date edition.
Isothermal Electromigration Test Procedure
Hardcopy , PDF
English
01-04-2025
This document describes a procedure for conducting the ISOthermal accelerated wafer level electromigration Test (ISOT) [1], [2], [3], [4] using computer-controlled instrumentation.
| DocumentType |
Standard
|
| Pages |
48
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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