JIS C 5005-2:2010
Current
Current
The latest, up-to-date edition.
Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Published date
20-05-2010
Publisher
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61193-2:2007 | Identical |
2010 [20/05/2010]
| JIS C 5260-3:2025 | Potentiometers for use in electronic equipment-Part 3: Sectional specification: Rotary precision potentiometers |
| JIS C 5201-8:2025 | Fixed resistors for use in electronic equipment-Part 8: Sectional specification: Fixed surface mount resistors |
| JIS C 5101-11:2025 | Fixed capacitors for use in electronic equipment-Part 11: Sectional specification-Fixed polyethylene-terephthalate film dielectric metal foil DC capacitors |
| JIS C 5101-1:2023 | Fixed capacitors for use in electronic equipment -- Part 1: Generic specification |
Summarise
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