JIS C 5750-3-5:2006
Current
Current
The latest, up-to-date edition.
Dependability management -- Part 3-5: Application guide -- Reliability test conditions and statistical test principles
Published date
25-03-2006
Publisher
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60300-3-5:2001 | Identical |
2006(R2010) [01/10/2010]2006 [25/03/2006]
| JIS C 5750-2:2000 | Dependability management -- Part 2: Dependability programme elements and tasks |
| JIS C 5750-3-4:2003 | Dependability management -- Part 3-4: Application guide -- Guide to the specification of dependability requirements |
| JIS Z 8115:2000 | Glossary of terms used in dependability |
| JIS C 5750-3-7:2003 | Dependability management -- Part 3-7: Application guide -- Reliability stress screening of electronic hardware |
| JIS Z 9041-3:1999 | Statistical interpretation of data -- Part 3: Tests and confidence intervals relating to proportions Part 3: Tests and confidence intervals relating to proportions |
| JIS Z 8101-1:1999 | Statistics -- Vocabulary and symbols -- Part 1: Probability and general statistical terms Part 1: Probability and general statistical terms |
| JIS C 8201-1:2020 | Low-voltage switchgear and controlgear -- Part 1: General rules |
| JIS C 5750-3-1:2006 | Dependability management -- Part 3-1: Application guide -- Analysis techniques for dependability -- Guide on methodology |
| JIS C 5750-3-2:2008 | Dependability management -- Part 3-2: Application guide -- Collection of dependability data from the field |
Summarise
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