JIS C 60068-2-20:2010
Withdrawn
View Superseded by
Environmental testing -- Part 2-20: Tests -- Test T: Test methods for solderability and resistance to soldering heat of devices with leads
English
20-05-2010
23-10-2025
This Japanese Industrial Standard outlines Test T, applicable to devices with leads.
| DocumentType |
Standard
|
| Pages |
23
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60068-2-20:1979 | Identical |
| IEC 60068-2-20:2008 | Identical |
Reaffirmed 2015 2010(R2015) [20/10/2015]2010 [20/05/2010]96(R2007) [20/03/2007]96(R2001) [20/02/2001]96 [01/07/1996]85
A newer version of this standard is available.
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.