JIS C 6115-1:2006
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
2006(R2010) [01/10/2010]2006 [20/01/2006]
| JIS C 60068-2-11:1989 | Basic environmental testing procedures Part 2: Tests -- Test Ka: Salt mist Part 2: Tests - Test Ka: Salt mist |
| JIS C 60068-2-7:1993 | Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state |
| JIS C 60068-2-32:1995 | Environmental testing Part 2: Tests. Test Ed: Free fall Part 2: Tests. Test Ed: Free fall |
| JIS Z 8202-4:2000 | Quantities and units -- Part 4: Heat |
| JIS Z 8202-0:2000 | Quantities and units -- Part 0: General principles |
| JIS Z 8202-1:2000 | Quantities and units -- Part 1: Space and time |
| JIS C 6115-2:2006 | Measuring methods of pin-FET modules |
| JIS Z 8202-2:2000 | Quantities and units -- Part 2: Periodic and related phenomena |
| JIS Z 8202-3:2000 | Quantities and units -- Part 3: Mechanics |
| JIS Z 8202-5:2000 | Quantities and units -- Part 5: Electricity and magnetism |
| JIS Z 8202-6:2000 | Quantities and units -- Part 6: Light and related electromagnetic radiations |
| JIS C 60068-2-21:2002 | Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing |
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering Part 2: Tests. Test T: Soldering |
| JIS C 6115-2:2006 | Measuring methods of pin-FET modules |
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