JIS R 1633:1998
Current
The latest, up-to-date edition.
Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
English
31-01-1998
This Japanese Industrial Standard specifies the sample preparation method of bulk fine ceramics and fine ceramic powders for scanning electron microscope (SEM) observation using the SEM which is capable f observing the sample not in the dry condition, the volatile sample, and the non-conductive sample, is not provided with any special function nor structure, and is capable of being using under the pressure in the sample chamber of 10*2 Pa or under.
| DocumentType |
Standard
|
| Pages |
3
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
Reaffirmed 2017
| JIS R 1600:1998 | Glossary of terms relating to fine ceramics |
| JIS H 7803:2005 | General rules for the determination of particle size and crystallite size in metal catalysts |
| JIS R 1670:2006 | Testing method for grain size in microstructure of fine ceramics |
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