NBN EN 60749-13 : 2003
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
Published date
12-01-2013
Publisher
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-13:2003-04 | Identical |
| BS EN 60749-13:2002 | Identical |
| I.S. EN 60749-13:2002 | Identical |
| UNE-EN 60749-13:2003 | Identical |
| EN 60749-13:2002 | Identical |
Summarise
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