NBN EN 62047-8 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 8: STRIP BENDING TEST METHOD FOR TENSILE PROPERTY MEASUREMENT OF THIN FILMS
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-8:2011 | Identical |
| EN 62047-8:2011 | Identical |
Summarise
Sorry this product is not available in your region.