NEN 11580-9 : 1996
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The latest, up-to-date edition.
METHODS OF MEASUREMENT FOR WAVEGUIDES - PART 9: REFLECTION COEFFICIENT AT RECTANGULAR WAVEGUIDE INTERFACES
Published date
12-01-2013
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Determines the reflection coefficient at the junction of two similar rectangular waveguides due to the following imperfections: a) differences in the waveguide internal dimensions; b) lateral displacement between the waveguide axes in either the H or E plane; c) angular misalignment between the waveguide axes.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61580-9:1996 | Identical |
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