Name: NEN EN IEC 60749-13 : 2002 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
Brand: Netherlands Standards

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Published date

12-01-2013

Publisher

Netherlands Standards

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Defines a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

DevelopmentNote	Supersedes NEN EN IEC 60749. (09/2011)
DocumentType	Standard
PublisherName	Netherlands Standards
Status	Current
Supersedes	NEN EN IEC 60749 : 99 AMD 2 2002