NEN EN IEC 60749-24 : 2004
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
Published date
12-01-2013
Publisher
Specifies the unbiased highly accelerated stress testing (HAST), which is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
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