Name: NEN EN IEC 60749-29 : 2011 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Brand: Netherlands Standards

Customer Support: +44 (0)203 327 3140

Login to i2i Subscription Intertek.com

Shopping Cart

There are no items in your cart
Log into your Account
Email Address * Please enter your email Password * Please enter your password Forgot password?
Create account?
Error occured. Please try again

We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.

Go to AMERICAS site

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST

Published date

12-01-2013

Publisher

Netherlands Standards

Add to Watchlist

Sorry this product is not available in your region.

Defines the I-test and the overvoltage latch-up testing of integrated circuits. Also defines a method for determining integrated circuit (IC) latchup characteristics and specifies latch-up failure criteria.