NEN EN IEC 60749-3 : 2017
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
Published date
12-01-2013
Publisher
Validates that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
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