NEN EN IEC 60749-37 : 2008
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER
Published date
12-01-2013
Publisher
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Defines a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure.
| DevelopmentNote |
Supersedes NEN NPR IEC/PAS 62050. (05/2008)
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| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
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| Status |
Current
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| Supersedes |
| Standards | Relationship |
| EN 60749-37:2008 | Identical |
| IEC 60749-37:2008 | Identical |
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