NEN EN IEC 61338-1-5 : 2015
Current
Current
The latest, up-to-date edition.
WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
Published date
02-11-2015
Publisher
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Explains a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.
| DevelopmentNote |
Supersedes NEN NPR IEC/PAS 61338-1-5. (10/2015)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 61338-1-5:2015 | Identical |
| IEC 61338-1-5:2015 | Identical |
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