Name: NEN IEC 60748-4-3 : 2006 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 4-3: INTERFACE INTEGRATED CIRCUITS - DYNAMIC CRITERIA FOR ANALOGUE-DIGITAL CONVERTERS (ADC)
Brand: Netherlands Standards

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SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 4-3: INTERFACE INTEGRATED CIRCUITS - DYNAMIC CRITERIA FOR ANALOGUE-DIGITAL CONVERTERS (ADC)

Published date

12-01-2013

Publisher

Netherlands Standards

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Defines a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.