Name: NEN ISO 17901-2 : 2015 - OPTICS AND PHOTONICS - HOLOGRAPHY - PART 2: METHODS FOR MEASUREMENT OF HOLOGRAM RECORDING CHARACTERISTICS
Brand: Netherlands Standards

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OPTICS AND PHOTONICS - HOLOGRAPHY - PART 2: METHODS FOR MEASUREMENT OF HOLOGRAM RECORDING CHARACTERISTICS

Published date

12-08-2015

Publisher

Netherlands Standards

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Defines the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference.