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NEN-ISO 24173:2024

Current

Current

The latest, up-to-date edition.

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

Published date

01-02-2024

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NEN-ISO 24173 gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).

Committee
ISO/TC 202
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
ISO 24173:2024 Identical

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