Name: NEN ISO 25498 : 2018 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE
Brand: Netherlands Standards

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MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE

Published date

12-01-2013

Publisher

Netherlands Standards

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Defines the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens.