Name: NEN NPR IEC/TS 62132-9 : 2014 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD
Brand: Netherlands Standards

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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD

Published date

20-10-2014

Publisher

Netherlands Standards

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Defines a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC).