NF EN 60749-31 : 2003
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
Published date
12-01-2013
Publisher
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Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
| DevelopmentNote |
Indice de classement: C96-022-31. (12/2003) Supersedes NF EN 60749. (06/2007)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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| Standards | Relationship |
| DIN EN 60749-31:2003-12 | Identical |
| I.S. EN 60749-31:2003 | Identical |
| EN 60749-31:2003 | Identical |
| IEC 60749-31:2002 | Identical |
| UNE-EN 60749-31:2004 | Identical |
| BS EN 60749-31:2003 | Identical |
Summarise
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