NF EN 62047-4 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 4: GENERIC SPECIFICATIONS FOR MEMS
Published date
12-01-2013
Publisher
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| DevelopmentNote |
Indice de classement: C96-050-4. PR NF EN 62047-4 July 2007. (07/2007)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-4:2008 | Identical |
| EN 62047-4:2010 | Identical |
| NF ISO 2859-1 : 2000 AMD 1 2011 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION |
Summarise
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