NS EN 12698-2 : 1ED 2007

Foreword
1 Scope
2 Normative references
3 Definitions
4 Apparatus
5 Sampling
6 Procedure
  6.1 Sample preparation
  6.2 Measuring parameters
  6.3 Qualitative analysis
  6.4 Quantitative analysis
7 Precision
  7.1 Repeatability
  7.2 Reproducibility
8 Test report
Annex A (normative) X-ray diffraction data for the
        determination of Beta'-SiAION content
  A.1 General
  A.2 Example of calculation of z-value for Beta'-SiAION
Bibliography

Specifies methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.