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PD ISO/TR 21477:2017

Current
Current

The latest, up-to-date edition.

Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems
Published date

27-09-2017

This document intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO10110‑7 and ISO14997 , specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

Committee
CPW/172
DocumentType
Standard
PublisherName
British Standards Institution
Status
Current

Standards Relationship
ISO/TR 21477:2017 Identical

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