Name: PN EN 60749-23 : 2006 AMD 1 2011 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE
Brand: Polish Committee for Standardization

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE

Published date

12-01-2013

Publisher

Polish Committee for Standardization

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Finds out the effects of bias conditions and temperature on solid state devices over time.

Committee	TC 60
DevelopmentNote	AMD 1 2011 is only available in English. (07/2011)
DocumentType	Standard
PublisherName	Polish Committee for Standardization
Status	Current