Name: PN EN 60749-27 : 2008 AMD 1 2013 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
Brand: Polish Committee for Standardization

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

Published date

12-01-2013

Publisher

Polish Committee for Standardization

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Committee	TC 60
DevelopmentNote	AMD 1 2013 is only available in English. (09/2013)
DocumentType	Standard
PublisherName	Polish Committee for Standardization
Status	Current