PN EN 60749-7 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES
Published date
12-01-2013
Publisher
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Pertains to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-7:2011 | Identical |
| EN 60749-7:2011 | Identical |
Summarise
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