SAC GB/T 4937-3 : 2012
Current
Current
The latest, up-to-date edition.
Semiconductor Device Mechanical and Climate Testing Methods Part 3: External Visual Inspection
Available format(s)
Hardcopy
Language(s)
English
Published date
06-03-2013
Publisher
Excluding VAT
| DocumentType |
Test Method
|
| Pages |
763
|
| PublisherName |
Standardization Administration of China
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-3:2017 | Identical |
Summarise